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Volumn 583, Issue 1, 2007, Pages 64-70

CCE measurements and annealing studies on proton-irradiated p-type MCz silicon diodes

Author keywords

Annealing; CCE; MCz; P Type; Radiation hardness; RD50; Silicon

Indexed keywords

ANNEALING; DIODES; DOPING (ADDITIVES); LEAKAGE CURRENTS; PROTON IRRADIATION; RADIATION HARDENING;

EID: 36448934893     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.08.201     Document Type: Article
Times cited : (6)

References (18)
  • 1
    • 36448990699 scopus 로고    scopus 로고
    • The ROSE Collaboration (R&D On Silicon for future Experiments), CERN-RD48 Collaboration, 〈http://rd48.web.cern.ch/RD48/〉.
  • 4
    • 36448935925 scopus 로고    scopus 로고
    • A.G. Bates, et al., LHCb-2004-052 VELO, 2004.
  • 10
    • 36448967711 scopus 로고    scopus 로고
    • A. Pozza at the 2nd Trento Workshop, 2006 〈http://tredi.itc.it/program/talks/p-type/pozza.ppt〉.
  • 12
    • 36448996500 scopus 로고    scopus 로고
    • D. Menichelli, Workshop on defect analysis in radiation damaged silicon detectors, Hamburg-DESY, August-2006. 〈http://wwwiexp.desy.de/seminare/defect.analysis.workshop.august.2006/menichelli_hamburg06.ppt〉.
  • 15
    • 36448971141 scopus 로고    scopus 로고
    • Description and manual of the NIKHEF CCE setup: 〈http://www.nikhef.nl/~i56/Manual.pdf〉.
  • 16
    • 36448979454 scopus 로고    scopus 로고
    • G. Kramberger at the 8th RD50 Workshop in Prag 2006. 〈http://rd50.web.cern.ch/rd50/8th-workshop/default.htm〉.
  • 17
    • 36448961844 scopus 로고    scopus 로고
    • M. Moll, Radiation damage in silicon particle detectors-microscopic defects and macroscopic properties, Ph.D. Thesis, DESY-THESIS-1999-040, University of Hamburg, December 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.