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Journal of Applied Physics

Volumn 84, Issue 1, 1998, Pages 237-247

X-ray diffraction study of intentionally disordered (GaIn)As/Ga(PAs) heterostructures

(4) Rettig, R a Marschner, T a,c Stolz, W a,d Tapfer, L b

a PHILIPPS UNIVERSITY MARBURG (Germany)

b Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali (Italy)

c IMEC (Belgium)

d Fachbereich Chemie (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3643079694 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.368074 Document Type: Article

Times cited : (1)

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