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Volumn 50, Issue 5, 2007, Pages 1907-1911

Automatic unhulled rice grain crack detection by X-ray imaging

Author keywords

Cracks; Detection; Paddy; Segmentation; X ray

Indexed keywords

ALGORITHMS; GRAPHICAL USER INTERFACES; HOUGH TRANSFORMS; IMAGING TECHNIQUES; LIGHT; X RAYS;

EID: 36249022760     PISSN: 21510032     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (16)

References (16)
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  • 5
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    • Automatic, nondestructive detection of corn kernel defects
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    • Gunasekaran, S.1    Paulsen, M.R.2
  • 6
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    • Soybean seed coat and cotyledon crack detection by image processing
    • Gunasekaran, S., T. M. Cooper, and A. G. Berlage. 1988. Soybean seed coat and cotyledon crack detection by image processing. J. Agric. Eng. Res. 41(2): 139-148.
    • (1988) J. Agric. Eng. Res , vol.41 , Issue.2 , pp. 139-148
    • Gunasekaran, S.1    Cooper, T.M.2    Berlage, A.G.3
  • 9
    • 3042723544 scopus 로고    scopus 로고
    • Real-time x-ray inspection of wheat for infestation by granary weevil, Sitophilus granarius (L.)
    • Haff, R. P., and D. C. Slaughter. 2004. Real-time x-ray inspection of wheat for infestation by granary weevil, Sitophilus granarius (L.). Trans. ASAE 47(2): 531-537.
    • (2004) Trans. ASAE , vol.47 , Issue.2 , pp. 531-537
    • Haff, R.P.1    Slaughter, D.C.2
  • 10
    • 0141678847 scopus 로고    scopus 로고
    • Soft x-ray inspection of wheat kernels infested by Sitophilus oryzae
    • Karunakaran, C., D. S. Jayas, and N. D. G. White. 2003a. Soft x-ray inspection of wheat kernels infested by Sitophilus oryzae. Trans. ASAE 46(3): 739-745.
    • (2003) Trans. ASAE , vol.46 , Issue.3 , pp. 739-745
    • Karunakaran, C.1    Jayas, D.S.2    White, N.D.G.3
  • 11
    • 0141679627 scopus 로고    scopus 로고
    • X-ray image analysis to detect infestations caused by insects in grain
    • Karunakaran, C., D. S. Jayas, and N. D. G. White. 2003b. X-ray image analysis to detect infestations caused by insects in grain. Cereal Chem. 80(5): 553-557.
    • (2003) Cereal Chem , vol.80 , Issue.5 , pp. 553-557
    • Karunakaran, C.1    Jayas, D.S.2    White, N.D.G.3
  • 12
    • 1542789505 scopus 로고    scopus 로고
    • Identification of wheat kernels damaged by red flour beetle using x-ray images
    • Karunakaran, C., D. S. Jayas, and N. D. G. White. 2004. Identification of wheat kernels damaged by red flour beetle using x-ray images. Biosystems Eng. 87(3): 267-274.
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    • Karunakaran, C.1    Jayas, D.S.2    White, N.D.G.3
  • 13
    • 0035657383 scopus 로고    scopus 로고
    • Detection of pinholes in almonds through x-ray imaging
    • Kim, S., and T. Schatzki. 2001. Detection of pinholes in almonds through x-ray imaging. Trans. ASAE 44(4): 997-1003.
    • (2001) Trans. ASAE , vol.44 , Issue.4 , pp. 997-1003
    • Kim, S.1    Schatzki, T.2
  • 14
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    • Internal inspection of deboned poultry using x-ray imaging and adaptive thresholding
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    • (2001) Trans. ASAE , vol.44 , Issue.4 , pp. 1005-1009
    • Tao, Y.1    Chen, Z.2    Jing, H.3    Walker, J.4
  • 15
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    • Non-destructive detection of seed weevil-infested mango fruits by x-ray imaging
    • Thomas, P., A. Kannan, V. H. Degwekar, and M. S. Ramamurthy. 1995. Non-destructive detection of seed weevil-infested mango fruits by x-ray imaging. Postharvest Biol. Tech. 5(1): 161-165.
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  • 16
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    • Rice quality classification using an automatic grain quality inspection system
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    • (2002) Trans. ASAE , vol.45 , Issue.2 , pp. 379-387
    • Wan, Y.N.1    Lin, C.M.2    Chiou, J.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.