X-ray image analysis to detect infestations caused by insects in grain

Cereal Chemistry

Volumn 80, Issue 5, 2003, Pages 553-557

  Karunakaran, C ^a   Jayas, D S ^a   White, N D G ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b Cereal Research Centre   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); GRAPHIC METHODS; X RAY ANALYSIS;

CHEMICAL CHARACTERISTIC; DIFFERENT STAGES; FALSE POSITIVE; IMAGE-ANALYSIS; INSECT INFESTATIONS; PARAMETRIC CLASSIFIER; T. CASTANEUM; WHEAT FLOURS; WHEAT KERNELS; X-RAY IMAGE;

GRAIN (AGRICULTURAL PRODUCT);

ARTICLE; FLOUR; GRAIN; IMAGE ANALYSIS; INFESTATION; INSECT; NONHUMAN; SEED KERNEL; WHEAT; X RAY ANALYSIS;

HEXAPODA; INSECTA; PLODIA INTERPUNCTELLA; RHYZOPERTHA DOMINICA; SITOPHILUS ORYZAE; TRIBOLIUM CASTANEUM; TRITICUM AESTIVUM;

EID: 0141679627     PISSN: 00090352     EISSN: None     Source Type: Journal    
DOI: 10.1094/CCHEM.2003.80.5.553     Document Type: Article

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