Soft X-ray inspection of wheat kernels infested by Sitophilus oryzae

Transactions of the American Society of Agricultural Engineers

Volumn 46, Issue 3, 2003, Pages 739-745

  Karunakaran, Chithra ^a   Jayas, Digvir S ^a   White, Noel D G ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b Cereal Research Centre   (Canada)

Author keywords

Histogram; Infestation detection; Sitophilus oryzae; Soft X ray; Textural features; Wheat

Indexed keywords

FLUORESCENCE; FOOD PRODUCTS; SEED;

WHEAT KERNELS;

AGRICULTURE;

AGRICULTURAL TECHNOLOGY;

INSECTA; SITOPHILUS ORYZAE; TRITICUM AESTIVUM;

EID: 0141678847     PISSN: 00012351     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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