Picosecond time-resolved XAFS measurements using femtosecond laser-produced plasma soft x-ray as a probe

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6614, Issue , 2007, Pages

  Nakano, Hidetoshi ^a   Oguri, Katsuya ^a   Okano, Yasuaki ^a   Nishikawa, Tadashi ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

Laser produced plasma; Ultrafast; X ray microscope; X ray sources; X ray spectroscopy; XAFS

Indexed keywords

ALUMINUM; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; IMAGING SYSTEMS; IRRADIATION; PLASMA APPLICATIONS; SILICON;

SI FOIL; X RAY MICROSCOPE; X RAY SOURCES;

ULTRASHORT PULSES;

EID: 36248988071     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.740195     Document Type: Conference Paper

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