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Applied Optics
Volumn 46, Issue 26, 2007, Pages 6572-6576
Coupling of surface roughness to the performance of computer-generated holograms
Author keywords

[No Author keywords available]
Indexed keywords

DIFFRACTION; ETCHING; GRAPHIC METHODS; OPTICAL TESTING; SURFACE ROUGHNESS; WAVEFRONTS;
EID: 36248954182     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.006572     Document Type: Article
Times cited : (24)
References (6)
  • 1
    • 0021916151 scopus 로고
    • Analysis and applications of optical diffraction by gratings
    • T. K. Gaylord and M. G. Moharam, "Analysis and applications of optical diffraction by gratings," Proc. IEEE 73, 894-937 (1985).
    • (1985) Proc. IEEE , vol.73 , pp. 894-937
    • Gaylord, T.K.1    Moharam, M.G.2
  • 2
    • 33947095557 scopus 로고    scopus 로고
    • Fabrication error analysis and experimental demonstration for computer-generated holograms
    • P. Zhou and J. H. Burge, "Fabrication error analysis and experimental demonstration for computer-generated holograms," Appl. Opt. 46, (2007).
    • (2007) Appl. Opt , vol.46
    • Zhou, P.1    Burge, J.H.2
  • 3
    • 0033315573 scopus 로고    scopus 로고
    • Errors analysis for CGH optical testing
    • Y. C. Chang and J. H. Burge, "Errors analysis for CGH optical testing," Proc. SPIE 3782, 358-366 (1999).
    • (1999) Proc. SPIE , vol.3782 , pp. 358-366
    • Chang, Y.C.1    Burge, J.H.2
  • 4
    • 33749556212 scopus 로고    scopus 로고
    • Analysis of phase sensitivity for binary computer generated holograms
    • Y. C. Chang, P. Zhou, and J. H. Burge, "Analysis of phase sensitivity for binary computer generated holograms," Appl. Opt. 45, 4223-4234 (2006).
    • (2006) Appl. Opt , vol.45 , pp. 4223-4234
    • Chang, Y.C.1    Zhou, P.2    Burge, J.H.3
  • 5
    • 0025531474 scopus 로고
    • Light scattering from binary optics
    • D. W. Ricks and L. V. Chizek, "Light scattering from binary optics," Proc. SPIE 1211, 24-37 (1990).
    • (1990) Proc. SPIE , vol.1211 , pp. 24-37
    • Ricks, D.W.1    Chizek, L.V.2
  • 6
    • 0141608988 scopus 로고    scopus 로고
    • Interference microscope for subAngstrom surface roughness measurement
    • C. Saxer and K. Freischlad, "Interference microscope for subAngstrom surface roughness measurement," Proc. SPIE 5144, 37-45 (2003).
    • (2003) Proc. SPIE , vol.5144 , pp. 37-45
    • Saxer, C.1    Freischlad, K.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.