Trap filled limit voltage (VTFL) and V2 law in space charge limited currents

Journal of Applied Physics

Volumn 102, Issue 9, 2007, Pages

  Jain, Anubha ^a   Kumar, Pankaj ^b   Jain, S C ^b,c   Kumar, Vikram ^b   Kaur, R ^a   Mehra, R M ^a  

^a UNIVERSITY OF DELHI   (India)

^b NATIONAL PHYSICAL LABORATORY   (India)

^c IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS; ZINC OXIDE;

ENERGY DISTRIBUTIONS; INORGANIC SEMICONDUCTORS; TRAP CONCENTRATION; TRAP DISTRIBUTION;

ELECTRIC SPACE CHARGE;

EID: 36248946588     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2802553     Document Type: Article

References (20)

1. Rashmi, V. R. Balakrishnan, A. K. Kapoor, V. Kumar, S. C. Jain, R. Mertens, and S. Annapoorni, J. Appl. Phys. 94, 5302 (2003).
2. K. C. Kao and W. Hwang, Electrical Transport in Solids (Pergamon, Oxford, 1981).
3. M. A. Lampert and P. Mark, Current Injection in Solids (Academic, New York, 1970).
4. S. C. Jain, A. K. Kapoor, W. Geens, J. Poortmans, R. Mertens, and M. Willander, J. Appl. Phys. 0021-8979 10.1063/1.1503863 92, 3752 (2002); P. Kumar, A. Misra, M. N. Kamalasanan, S. C. Jain, and V. Kumar, J. Phys. D 40, 561 (2007).
5. S. C. Jain, A. K. Kapoor, W. Geens, J. Poortmans, R. Mertens, and M. Willander, J. Appl. Phys. 0021-8979 10.1063/1.1503863 92, 3752 (2002); P. Kumar, A. Misra, M. N. Kamalasanan, S. C. Jain, and V. Kumar, J. Phys. D 40, 561 (2007).
6. N. F. Mott and R. W. Gurney, Electronic Processes in Ionic Crystals (Oxford, New York, 1940).
7. W. Helfrich and P. Mark, Z. Phys. 0044-3328 10.1007/BF01384172 166, 370 (1962); W. Helfrich, P. Mark, Z. Phys. 168, 495 (1962).
8. W. Helfrich and P. Mark, Z. Phys. 0044-3328 10.1007/BF01384172 166, 370 (1962); W. Helfrich, P. Mark, Z. Phys. 168, 495 (1962).
9. S. C. Jain, W. Geens, A. Mehra, V. Kumar, T. Aernouts, J. Poortmans, R. Mertens, and M. Willander, J. Appl. Phys. 89, 3804 (2001).
10. A. Jain, P. Sagar, and R. M. Mehra, Solid-State Electron. 50, 1420 (2006).
11. R. Kaur, A. V. Singh, and R. M. Mehra, Phys. Status Solidi A 202, 1053 (2005).
12. G. G. Valle, P. Hammer, S. H. Pulcinelli, and C. V. Santilli, J. Eur. Ceram. Soc. 24, 1009 (2004).
13. X. D. Chen, C. C. Ling, S. Fung, C. D. Beling, Y. F. Mei, R. K. Y. Fu, G. G. Siu, and P. K. Chu, Appl. Phys. Lett. 88, 132104 (2006).
14. J. D. Ye, S. L. Gu, S. M. Zhu, W. Liu, S. M. Liu, R. Zhang, Y. Shi, and Y. D. Zheng, Appl. Phys. Lett. 88, 182112 (2006).
15. A. K. Ghosh, C. Fishman, and T. Feng, J. Appl. Phys. 51, 446 (1980).
16. C. W. Nan, S. Holten, R. Birringer, Haibin Gao, H. Kliem, and H. Gleiter, Phys. Status Solidi A 164, R1 (1997).
17. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, Physica B 391, 344 (2007).
18. F. S. Mahmood, R. D. Gould, A. K. Hassan, and H. M. Salih, Thin Solid Films 270, 376 (1995).
19. W. Jakubowski and D. H. Whitmore, J. Am. Ceram. Soc. 54, 161 (1971).
20. Y. Caglar, M. Caglar, S. Ilican, and F. Yakuphanoglu, Physica B 392, 99 (2007).