Trap filled limit of conducting organic materials

Journal of Applied Physics

Volumn 92, Issue 7, 2002, Pages 3752-3754

  Jain, S C ^a   Kapoor, Ashok K ^a   Geens, Wim ^a   Poortmans, J ^a   Mertens, R ^a   Willander, M ^b  

^a IMEC   (Belgium)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; CHARACTERISTIC TEMPERATURE; FREE HOLES; HIGH VOLTAGE; NUMERICAL SOLUTION; ORGANIC MATERIALS; TRAP DISTRIBUTIONS;

PHYSICAL PROPERTIES;

PHYSICS;

EID: 18644368712     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1503863     Document Type: Article

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