Critical currents Ic(77 K) > 350 A/cm-width achieved in ex situ YBCO coated conductors using a faster conversion process

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART III, 2005, Pages 2803-2807

  Feenstra, R ^a   Gapud, A A ^a   List, F A ^a   Specht, E D ^a   Christen, D K ^a   Holesinger, T G ^b   Feldmann, D M ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WISCONSIN   (United States)

Author keywords

BaF2 ex situ process; Critical currents; Thickness dependent effects; Vortex pinning; YBCO coated conductors

Indexed keywords

COATINGS; CRITICAL CURRENTS; EPITAXIAL GROWTH; GRAIN SIZE AND SHAPE; ITERATIVE METHODS; PARAMETER ESTIMATION; TEXTURES; YTTRIUM BARIUM COPPER OXIDES;

BAF2 EX SITU PROCESS; THICKNESS DEPENDENT EFFECTS; VORTEX PINNING; YBCO COATED CONDUCTORS;

ELECTRIC CONDUCTORS;

EID: 22044433459     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.848217     Document Type: Conference Paper

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