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Volumn 174, Issue 2, 2007, Pages 414-420

Microstructural characterisation of battery materials using powder diffraction data: DIFFaX, FAULTS and SH-FullProf approaches

Author keywords

Battery materials; DIFFaX; FAULTS; Microstructure; Powder diffraction; Rietveld

Indexed keywords

CHARACTERIZATION; CHEMICAL MODIFICATION; MICROSTRUCTURE; RIETVELD ANALYSIS; STACKING FAULTS; X RAY POWDER DIFFRACTION;

EID: 36148991779     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2007.06.216     Document Type: Article
Times cited : (49)

References (19)
  • 9
    • 85070144054 scopus 로고    scopus 로고
    • A. Audemer, Ph.D. Thesis, University of Picardie, 1997.
  • 16
    • 0003472812 scopus 로고
    • Dover Publications, New York p. 275
    • Warren B.E. X-Ray Diffraction (1990), Dover Publications, New York p. 275
    • (1990) X-Ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.