Failure analysis of failure analyses: The rules of the Rue Morgue, ten years later

IEEE Transactions on Device and Materials Reliability

Volumn 7, Issue 3, 2007, Pages 446-452

  Mura, Giovanna ^a   Vanzi, Massimo ^a  

^a UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Failure analysis (FA); Fault diagnosis; Insulated gate bipolar transistor; Microcomputer; Schottky diode

Indexed keywords

COMPUTER CRIME; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MICROCOMPUTERS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR DEVICE MANUFACTURE;

CRIME INVESTIGATION; MANUFACTURER OF THE DEVICE; UNSATISFACTORY OUTCOME;

FAILURE ANALYSIS;

EID: 35948965600     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2007.907428     Document Type: Article

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