A CTE matched, hard solder, passively cooled laser diode package combined with nXLT™ facet passivation enables high power, high reliability operation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6552, Issue , 2007, Pages

  Hodges, Aaron ^a   Wang, Jun ^a   DeFranza, Mark ^a   Liu, Xingsheng ^a   Vivian, Bill ^a   Johnson, Curt ^a   Crump, Paul ^a   Leisher, Paul ^a   DeVito, Mark ^a   Martinsen, Robert ^a   Bell, Jacob ^a  

^a NLIGHT CORPORATION   (United States)

Author keywords

AuSn, laser diode; Conductively cooled; CTE matched; Facet passivation; High power; High reliability

Indexed keywords

MIRRORS; POWER CONTROL; RELIABILITY THEORY; SOLDERING ALLOYS; TEMPERATURE CONTROL;

CONDUCTIVELY COOLING; CTE MATCHING; FACET PASSIVATION;

SEMICONDUCTOR LASERS;

EID: 35948944979     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.730700     Document Type: Conference Paper

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