CMOS temperature sensor with ring oscillator for mobile DRAM self-refresh control

Microelectronics Journal

Volumn 38, Issue 10-11, 2007, Pages 1042-1049

  Kim, Chan Kyung ^a,b   Lee, Jae Goo ^a   Jun, Young Hyun ^a   Lee, Chil Gee ^b   Kong, Bai Sun ^b  

^a Hynix Semiconductor Inc   (South Korea)

^b Sungkyunkwan University   (South Korea)

Author keywords

Bandgap reference; DRAM self refresh control; Ring oscillator; Temperature sensor

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC POWER UTILIZATION; INTEGRATED CIRCUITS; OSCILLATORS (ELECTRONIC); TEMPERATURE SENSORS;

BANDGAP REFERENCE; TEMPERATURE DEPENDENCY;

CMOS INTEGRATED CIRCUITS;

EID: 35848947954     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2007.08.003     Document Type: Article

References (11)

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