Refractive indices of layered semiconductor ferroelectrics TlIn S2, TlGa S2, and TlGa Se2 from ellipsometric measurements limited to only layer-plane surfaces

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Shim, Yonggu ^a   Okada, Wataru ^a   Wakita, Kazuki ^a   Mamedov, Nazim ^b  

^a Osaka Prefecture University   (Japan)

^b INSTITUTE OF PHYSICS   (Azerbaijan)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ELLIPSOMETRY; ENERGY GAP; FERROELECTRIC MATERIALS; LIGHT PROPAGATION; MEASUREMENT THEORY; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS;

ELLIPSOMETRIC MEASUREMENTS; EXPERIMENTAL INTENSITIES; SINGLE OSCILLATOR;

SEMICONDUCTOR MATERIALS;

EID: 35648964174     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2800827     Document Type: Article

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