Refraction and scattering of X-rays in analyzer-based imaging

Journal of Synchrotron Radiation

Volumn 14, Issue 6, 2007, Pages 512-521

  Suhonen, Heikki ^a   Fernández, Manuel ^b   Bravin, Alberto ^b   Keyriläinen, Jani ^b   Suortti, Pekka ^a,b  

^a Department of Physical Sciences ^*  (Finland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Analyzer based imaging; Diffraction enhanced imaging; Voigtian function; X ray scattering

Indexed keywords

ABSORPTION; GAUSSIAN BEAMS; REFRACTION; SYNCHROTRON RADIATION; X RAY SCATTERING;

DIFFRACTION ENHANCED IMAGING; GAUSSIAN FUNCTIONS; ROCKING CURVES; VOIGTIAN FUNCTIONS;

IMAGING SYSTEMS;

BEHENIC ACID; FATTY ACID; POLY(METHYL METHACRYLATE);

ARTICLE; CHEMISTRY; IMAGE QUALITY; PAPER; RADIATION SCATTERING; X RAY;

FATTY ACIDS; PAPER; PHANTOMS, IMAGING; POLYMETHYL METHACRYLATE; SCATTERING, RADIATION; X-RAYS;

EID: 35548971918     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507044664     Document Type: Article

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