Residual stress evolution during decomposition of Ti(1-x)Al (x)N coatings using high-energy x-rays

Materials Science Forum

Volumn 524-525, Issue , 2006, Pages 619-624

  Terner, M R ^a   Hedstrom P ^a   Almer, J ^b   Llavsky, J ^b   Oden M ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Ceramic coatings; SAXS; Small angle x ray scattering; Synchrotron radiation; TiAIN; WAXS; X ray diffraction; X ray scattering

Indexed keywords

ANNEALING; COMPRESSIVE STRESS; PHASE SEPARATION; RESIDUAL STRESSES; SYNCHROTRON RADIATION; X RAY DIFFRACTION; X RAY SCATTERING; X RAYS;

COMPRESSIVE RESIDUAL STRESS; SYNCHROTRON SOURCE; TRANSMISSION GEOMETRY;

CERAMIC COATINGS;

EID: 35449007191     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.524-525.619     Document Type: Conference Paper

References (8)

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