TEM and SIMS analysis of (100), (110), and (111) single crystal niobium

AIP Conference Proceedings

Volumn 927, Issue , 2007, Pages 72-83

  Batchelor, A D ^a   Leonard, D N ^b   Russell, P E ^c   Stevie, F A ^a   Griffis, D P ^a,b   Myneni, G R ^d  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b North Carolina State University   (United States)

^c APPALACHIAN STATE UNIVERSITY   (United States)

^d THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY   (United States)

Author keywords

Accelerators; SIMS; Superconducting materials; TEM

Indexed keywords

EID: 35348994532     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2770680     Document Type: Conference Paper

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