Quantitative elemental analysis of Della Robbia glazes with a portable XRF spectrometer and its comparison to PIXE methods

X-Ray Spectrometry

Volumn 35, Issue 6, 2006, Pages 365-369

  Gianoncelli, A ^a   Castaing, J ^a   Bouquillon, A ^a   Polvorinos, A ^b   Walter, P ^a  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

^b UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROMETERS;

ELEMENTAL COMPOSITIONS; EMISSION METHOD; EMISSION TECHNIQUES; PARTICLE INDUCED X-RAY EMISSION; PORTABLE XRF; QUANTITATIVE ELEMENTAL ANALYSIS; SEVILLE; WORK OF ART;

GLAZES;

EID: 33845630267     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.920     Document Type: Conference Paper

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