SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 31, Issue 1, 2002, Pages 92-99

Determination of the thickness of coatings by means of a new XRF spectrometer

(4) Fiorini, C a Gianoncelli, A a Longoni, A a Zaraga, F a

a POLITECNICO DI MILANO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; DIODES; FLUORESCENCE; QUALITY CONTROL; SUBSTRATES;

ACTIVE AREA; ANALYSIS TECHNIQUES; ELECTRONIC NOISE; EQUIVALENT AREAS; EQUIVALENT THICKNESS; KEY FEATURE; SILICON DIODES; SILICON DRIFT DETECTOR; STANDARD SAMPLES; XRF ANALYSIS;

SPECTROMETERS;

EID: 0036117024 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/xrs.550 Document Type: Article

Times cited : (58)

References (17)

1
- 0041792789
- Ebel H, Derdau J, Pollai G. Spectrochim. Acta, Part B 1971; 26: 237.
- (1971) Spectrochim. Acta, Part B , vol.26 , pp. 237
- Ebel, H.¹ Derdau, J.² Pollai, G.³

2
- 25544471661
- Ebel H, Mayr M. Spectrochim. Acta, Part B 1971; 26: 291.
- (1971) Spectrochim. Acta, Part B , vol.26 , pp. 291
- Ebel, H.¹ Mayr, M.²

3
- 84981805598
- de Boer DKG. X-Ray Spectrom. 1989; 18: 119.
- (1989) X-Ray Spectrom. , vol.18 , pp. 119
- De Boer, D.K.G.¹

4
- 84981767203
- de Boer DGK. X-Ray Spectrom. 1990; 19: 145.
- (1990) X-Ray Spectrom. , vol.19 , pp. 145
- De Boer, D.G.K.¹

5
- 84981795552
- de Boer DGK, Borstrok JJM, Leonaers AJG, van Sprang HA, Brouwer PN. X-Ray Spectrom. 1993; 22: 33.
- (1993) X-Ray Spectrom. , vol.22 , pp. 33
- De Boer, D.G.K.¹ Borstrok, J.J.M.² Leonaers, A.J.G.³ Van Sprang, H.A.⁴ Brouwer, P.N.⁵

6
- 0031487644
- Bekkers MHJ, van Sprang HA. X-Ray Spectrom. 1997; 26: 122.
- (1997) X-Ray Spectrom. , vol.26 , pp. 122
- Bekkers, M.H.J.¹ Van Sprang, H.A.²

7
- 84981791634
- Huang TC. X-Ray Spectrom. 1991; 20: 29.
- (1991) X-Ray Spectrom. , vol.20 , pp. 29
- Huang, T.C.¹

8
- 84981778057
- Rössiger V. X-Ray Spectrom. 1988; 17: 107.
- (1988) X-Ray Spectrom. , vol.17 , pp. 107
- Rössiger, V.¹

9
- 84981768046
- Rössiger V, Thomas HJ. X-Ray Spectrom. 1990; 19: 211.
- (1990) X-Ray Spectrom. , vol.19 , pp. 211
- Rössiger, V.¹ Thomas, H.J.²

10
- 84981793133
- Fan Q. X-Ray Spectrom. 1993; 22: 11.
- (1993) X-Ray Spectrom. , vol.22 , pp. 11
- Fan, Q.¹

11
- 21144461646
- Wegrzynek D, Holynska B, Pilarski T. X-Ray Spectrom. 1993; 22: 80.
- (1993) X-Ray Spectrom. , vol.22 , pp. 80
- Wegrzynek, D.¹ Holynska, B.² Pilarski, T.³

12
- 84981788725
- Willis JE. X-Ray Spectrom. 1989; 18: 143.
- (1989) X-Ray Spectrom. , vol.18 , pp. 143
- Willis, J.E.¹

13
- 48549113488
- Gatti E, Rehak P. Nucl. Instrum. Methods A 1984; 225: 608.
- (1984) Nucl. Instrum. Methods A , vol.225 , pp. 608
- Gatti, E.¹ Rehak, P.²

14
- 0000180718
- Fiorini C, Longoni A. Revi. Sci. Instrum. 1998; 69: 1523.
- (1998) Revi. Sci. Instrum. , vol.69 , pp. 1523
- Fiorini, C.¹ Longoni, A.²

15
- 84981796724
- Rousseau RM. X-Ray Spectrom. 1984; 13: 115.
- (1984) X-Ray Spectrom. , vol.13 , pp. 115
- Rousseau, R.M.¹

16
- 0033307441
- Fiorini C, Longoni A. IEEE Trans. Nucl. Sci. 1999; 46: 2011.
- (1999) IEEE Trans. Nucl. Sci. , vol.46 , pp. 2011
- Fiorini, C.¹ Longoni, A.²

17
- 0030214002
- Lechner P et al. Nucl. Instrum. Methods A 1996; 377: 346.
- (1996) Nucl. Instrum. Methods A , vol.377 , pp. 346
- Lechner, P.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.