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Volumn , Issue , 2006, Pages 168-173

Improvement of drop reliability in OSP/Cu pad finished packages

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); BRAZING; COPPER; COPPER ALLOYS; DROPS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; ETCHING; FLUID MECHANICS; FRACTURE; FRACTURE FIXATION; NATURAL FREQUENCIES; NICKEL; TECHNOLOGY; TESTING; WELDING;

EID: 35348912294     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2006.342710     Document Type: Conference Paper
Times cited : (12)

References (8)
  • 1
    • 30844472660 scopus 로고    scopus 로고
    • Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition
    • Yi-Shao Lai et al., "Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition", Microelectronics Reliability vol. 46, 2006, p.645-650.
    • (2006) Microelectronics Reliability , vol.46 , pp. 645-650
    • Lai, Y.-S.1
  • 3
    • 33845597333 scopus 로고    scopus 로고
    • Masamoto Tanaka et al., Improvement in Drop Shock Reliabiliy of Sn-1.2Ag-0.5Cu BGA Interconnects by Ni Addition, 2006 EPTC, p.78-84.
    • Masamoto Tanaka et al., "Improvement in Drop Shock Reliabiliy of Sn-1.2Ag-0.5Cu BGA Interconnects by Ni Addition", 2006 EPTC, p.78-84.
  • 5
    • 50249083637 scopus 로고    scopus 로고
    • JESD22-B111
    • JESD22-B111.
  • 6
    • 16544377116 scopus 로고    scopus 로고
    • Experimental and Finite Element Analysis of the Shear Speed Effects on the Sn-Ag and Sn-Ag-Cu BGA solder joints
    • Jong-Woong Kim and Seung-Boo Jung, "Experimental and Finite Element Analysis of the Shear Speed Effects on the Sn-Ag and Sn-Ag-Cu BGA solder joints", Materials Science and Engineering A, vol. 371, 2004, p.267-276.
    • (2004) Materials Science and Engineering A , vol.371 , pp. 267-276
    • Kim, J.-W.1    Jung, S.-B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.