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Volumn , Issue , 2007, Pages 1320-1325

C4NP technology for lead free solder bumping

Author keywords

[No Author keywords available]

Indexed keywords

C4NP TECHNOLOGY; GLASS MOLDS; LEAD FREE SOLDER; SOLDER BUMPING TECHNOLOGY;

EID: 35348910107     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373966     Document Type: Conference Paper
Times cited : (13)

References (6)
  • 1
    • 25844510182 scopus 로고    scopus 로고
    • Low Cost Wafer Bumping
    • July/September
    • P.A. Gruber, et al., "Low Cost Wafer Bumping", IBM J. Res. & Dev. Vol. 49 No. 4/5, July/September 2005
    • (2005) IBM J. Res. & Dev , vol.49 , Issue.4-5
    • Gruber, P.A.1
  • 2
    • 29144434843 scopus 로고    scopus 로고
    • C4NP: New Solder Bumping Technology - Low Cost and Lead Free
    • Austin, TX, June
    • K. Ruhmer et al., "C4NP: New Solder Bumping Technology - Low Cost and Lead Free", IMAPS Flip Chip Advanced Technology Workshop, Austin, TX, June 2005.
    • (2005) IMAPS Flip Chip Advanced Technology Workshop
    • Ruhmer, K.1
  • 3
    • 34250818614 scopus 로고    scopus 로고
    • C4NP: Lead-Free and Low Cost Solder Bumping Technology for Flip Chip and WLCSP
    • K. Ruhmer et al., "C4NP: Lead-Free and Low Cost Solder Bumping Technology for Flip Chip and WLCSP", Pan Pacific conference 2006.
    • (2006) Pan Pacific conference
    • Ruhmer, K.1
  • 4
    • 35348847430 scopus 로고    scopus 로고
    • Formation and Characterization of Cobalt-Reinforced Sn-3.5Ag Solder
    • San Diego, June
    • Lee, et al., "Formation and Characterization of Cobalt-Reinforced Sn-3.5Ag Solder", 56th ECTC, San Diego, June 2006
    • (2006) 56th ECTC
    • Lee1
  • 5
    • 33845562099 scopus 로고    scopus 로고
    • The Influence of Low Level Doping on the Thermal Evolution of SAC Alloy Solder Joints with Cu Pad Structures
    • San Diego, June
    • De Sousa et al., "The Influence of Low Level Doping on the Thermal Evolution of SAC Alloy Solder Joints with Cu Pad Structures", 56th ECTC, San Diego, June 2006
    • (2006) 56th ECTC
    • Sousa, D.1
  • 6
    • 35348913098 scopus 로고    scopus 로고
    • Development and Implementation of C4NP Technology for 300 mm wafers
    • Reno, June
    • th ECTC, Reno, June 2007
    • (2007) th ECTC
    • Giri, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.