Anisotropy of the strength of Si studied by a laser-based contact-free method

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 14, 2007, Pages

  Kozhushko, Victor V ^a   Hess, Peter ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35348882691     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.144105     Document Type: Article

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