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1
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33845579477
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Development of High-Density Inter-Chip-Connection Structure Package
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Osaka, Japan, Oct
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th Micro Electronics Symposium (MES 2005), Osaka, Japan, Oct., 2005, pp. 189-192.
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(2005)
th Micro Electronics Symposium (MES
, pp. 189-192
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Kurita, Y.1
Soejima, K.2
Kikuchi, K.3
Takahashi, M.4
Tago, M.5
Koike, M.6
Morishita, Y.7
Yamamichi, S.8
Kawano, M.9
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2
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35348912897
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Inter-chip Connection Structure through an Interposer with High Density Via
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Mate, Yokohama, Japan, Feb
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th Symposium on "Microjoining and Assembly Technology in Electronics" (Mate 2006), Yokohama, Japan, Feb., 2006, pp. 423-426.
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(2006)
th Symposium on Microjoining and Assembly Technology in Electronics
, pp. 423-426
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Takahashi, M.1
Tago, M.2
Kurita, Y.3
Soejima, K.4
Kawano, M.5
Kikuchi, K.6
Yamamichi, S.7
Murakami, T.8
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3
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33845567961
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A Novel "SMAFTI" Package for Inter-Chip Wide-Band Data Transfer
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San Diego, CA, May/June
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th Electric Components and Technology Conference (ECTC 2006), San Diego, CA, May/June, 2006, pp. 289-297.
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(2006)
th Electric Components and Technology Conference (ECTC
, pp. 289-297
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Kurita, Y.1
Soejima, K.2
Kikuchi, K.3
Takahashi, M.4
Tago, M.5
Koike, M.6
Shibuya, K.7
Yamamichi, S.8
Kawano, M.9
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4
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35348859931
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Development of CoW (Chip on Wafer) bonding process with high density SiP (System in Package) technology "SMAFTI
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Osaka, Japan, Oct
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th Micro Electronics Symposium (MES 2006), Osaka, Japan, Oct., 2006, pp. 35-38.
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(2006)
th Micro Electronics Symposium (MES
, pp. 35-38
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Nanba, K.1
Tago, M.2
Kurita, Y.3
Soejima, K.4
Kawano, M.5
Kikuchi, K.6
Yamamichi, S.7
Murakami, T.8
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5
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35348866511
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Development of BGA attach process with high density Sip technology "SMAFTI
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Mate, Yokohama, Japan, Feb
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th Symposium on "Microjoining and Assembly Technology in Electronics" (Mate 2007), Yokohama, Japan, Feb., 2007, pp. 49-54.
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(2007)
th Symposium on Microjoining and Assembly Technology in Electronics
, pp. 49-54
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Kawashiro, F.1
Abe, K.2
Shibuya, K.3
Koike, M.4
Ujiie, M.5
Kawashima, T.6
Kurita, Y.7
Soejima, Y.8
Kawano, M.9
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6
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46049089466
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A 3D Packaging Technology for 4 Gbit Stacked DRAM with 3 Gbps Data Transfer
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San Francisco, CA, Dec
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M. Kawano, S. Uchiyama, Y. Egawa, N. Takahashi, Y. Kurita, K. Soejima, M. Komuro, S. Matsui, K. Shibata, J. Yamada, M. Ishino, H. Ikeda, Y. Saeki, O. Kato, H. Kikuchi, and T. Mitsuhashi, "A 3D Packaging Technology for 4 Gbit Stacked DRAM with 3 Gbps Data Transfer," International Electron Devices Meeting Technical Digest (IEDM 2006), San Francisco, CA, Dec., 2006, pp. 581-584.
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(2006)
International Electron Devices Meeting Technical Digest (IEDM
, pp. 581-584
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Kawano, M.1
Uchiyama, S.2
Egawa, Y.3
Takahashi, N.4
Kurita, Y.5
Soejima, K.6
Komuro, M.7
Matsui, S.8
Shibata, K.9
Yamada, J.10
Ishino, M.11
Ikeda, H.12
Saeki, Y.13
Kato, O.14
Kikuchi, H.15
Mitsuhashi, T.16
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7
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35348817119
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T. Matsumoto, Y. Kudoh, M. Tahara, K-H. Yu, N. Miyakawa, H. Itani, T. Ichikizaki, A. Fujiwara, H. Tsukamoto, and M. Koyanagi, Extended Abstracts of the 1995 International Conference on Solid State Devices and Materials (SSDM), 1995, pp.1073-1074.
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T. Matsumoto, Y. Kudoh, M. Tahara, K-H. Yu, N. Miyakawa, H. Itani, T. Ichikizaki, A. Fujiwara, H. Tsukamoto, and M. Koyanagi, Extended Abstracts of the 1995 International Conference on Solid State Devices and Materials (SSDM), 1995, pp.1073-1074.
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8
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10444221697
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Process Integration of 3D Chip Stack with Vertical Interconnection
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th Electric Components and Technology Conference (ECTC 2004), 2004, pp. 601.
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(2004)
th Electric Components and Technology Conference (ECTC
, pp. 601
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Takahashi, K.1
Taguchi, Y.2
Tomisaka, M.3
Yonemura, H.4
Hoshino, M.5
Ueno, M.6
Egawa, Y.7
Nemoto, Y.8
Yamaji, Y.9
Terao, H.10
Umemoto, M.11
Kameyama, K.12
Suzuki, A.13
Okayama, Y.14
Yonezawa, T.15
Kondo, K.16
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9
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34250858194
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Design and Fabrication of 3D Microprocessors
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P. Morrow, B. Black, M. J. Kobrinsky, S. Muthukumar, D. Nelson, C. M. Park, and C. Webb, "Design and Fabrication of 3D Microprocessors," Proc. of Material Research Society Symposium, 2007.
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(2007)
Proc. of Material Research Society Symposium
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Morrow, P.1
Black, B.2
Kobrinsky, M.J.3
Muthukumar, S.4
Nelson, D.5
Park, C.M.6
Webb, C.7
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10
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24644443368
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Effect of the Cu Thickness on the Stability of a Ni/Cu Bilayer UBM of Lead Free Microbumps During Liquid and Solid State Aging
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Orland, FL, May/June
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th Electric Components and Technology Conference (ECTC 2005), Orland, FL, May/June, 2005, pp. 89-93.
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(2005)
th Electric Components and Technology Conference (ECTC
, pp. 89-93
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Jurenka, C.1
Kim, J.Y.2
Wolf, M.J.3
Engelmann, G.4
Ehrmann, O.5
Yu, J.6
Reichl, H.7
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