Nanoelectronics: Metrology and computation

AIP Conference Proceedings

Volumn 931, Issue , 2007, Pages 563-567

  Lundstrom, Mark ^a   Clark, Jason V ^a   Klimeck, Gerhard ^a   Raman, Arvind ^a  

^a Purdue University   (United States)

Author keywords

Cyberinfrastructure; Heterostructures; Modeling; NEMS; Scanning probe; Simulation

Indexed keywords

EID: 35348860738     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2799437     Document Type: Conference Paper

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