A numerical simulation code for electronic and ionic transients from a time-resolved pulsed townsend experiment

IEEE Transactions on Plasma Science

Volumn 35, Issue 5 I, 2007, Pages 1204-1209

  de Urquijo, J ^a   Juarez, A M ^a   Rodriguez Luna J C ^b   Ramos Salas, J S ^c  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b UNIVERSIDAD AUTÓNOMA DEL ESTADO DE MORELOS   (Mexico)

^c UNIVERSITY OF TEXAS PAN AMERICAN   (United States)

Author keywords

Attachment; Continuity equations; Diffusion; Drift velocity and diffusion; Electron and ion swarms; Electron detachment; Finite difference methods; Ionization; Ionization and attachment; Low temperature plasmas; Negative ions; Numerical simulation codes; Pulsed Townsend experiment

Indexed keywords

CODES (SYMBOLS); COMPUTER SIMULATION; FINITE DIFFERENCE METHOD; FORTRAN (PROGRAMMING LANGUAGE); NEGATIVE IONS; PULSED LASER APPLICATIONS;

CONTINUITY EQUATIONS; ELECTRON DETACHMENT; LOW TEMPERATURE PLASMAS; NUMERICAL SIMULATION CODES; PULSED TOWNSEND;

ELECTRIC DISCHARGES;

EID: 35348836069     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2007.905111     Document Type: Article

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