Improving the robustness of particle size analysis by multivariate statistical process control

Particle and Particle Systems Characterization

Volumn 24, Issue 3, 2007, Pages 173-183

  Mattila, Marko ^a   Saloheimo, Kari ^b   Koskinen, Kari ^a  

^a AALTO UNIVERSITY   (Finland)

^b OUTOTEC OYJ   (Finland)

Author keywords

Laser diffraction; Multivariate statistical process control; Particle size distribution; Principal component analysis; Robustness

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; PRINCIPAL COMPONENT ANALYSIS; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL PROCESS CONTROL;

LASER DIFFRACTION; MULTIVARIATE STATISTICAL PROCESS CONTROL; PARTICLE SIZE ANALYZER;

PARTICLE SIZE ANALYSIS;

EID: 35248898091     PISSN: 09340866     EISSN: 15214117     Source Type: Journal    
DOI: 10.1002/ppsc.200701094     Document Type: Article

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