Improving the sensitivity of forward light scattering technique to large particles

Particle and Particle Systems Characterization

Volumn 16, Issue 2, 1999, Pages 71-76

  Ma, Zhenhua ^a   Merkus, Henk G ^a   De Smet, Jan G A E ^a   Verheijen, Peter J T ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COMPUTER SIMULATION; CORRELATION METHODS; ELECTROMAGNETIC WAVE DIFFRACTION; LASER APPLICATIONS; LASER DIAGNOSTICS; LIGHT SCATTERING; PHOTODETECTORS; SPECTROSCOPIC ANALYSIS;

FORWARD LIGHT SCATTERING; LASER DIFFRACTION SPECTROSCOPY;

PARTICLE SIZE ANALYSIS;

EID: 0033340148     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4117(199906)16:2<71::AID-PPSC71>3.0.CO;2-2     Document Type: Article

References (5)

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2. M. I. S. Azzam, A. Futan, E. Rodriguez: Particle Size Characterisation of a Jet Mill Product via Principal Component Analysis. Part. Sci. Technol. 4 (1988) 95-104.
3. B. S. Everitt, G. Dunn: Applied Multivariate Data Analysis. Cambridge University Press, Cambridge 1991, pp. 45-64.
4. A. Boxman: Ph.D. Thesis, Delft University of Technology, 1991.
5. A. Boxman, H. G. Merkus, P. J. T. Verheijen, B. Scarlett: Deconvolution of Light Scattering Patterns by Observing Intensity Fluctuations. Appl. Opt. 30 (1991) 4818-4823.