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Volumn 32, Issue 11, 1989, Pages 961-964

A self consistent approach to IV-measurements on rectifying metal-semiconductor contacts

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER HEIGHT; IV-MEASUREMENTS; RECOMBINATION CURRENT; RECTIFYING METAL-SEMICONDUCTOR CONTACTS;

EID: 0024767982     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(89)90156-1     Document Type: Article
Times cited : (35)

References (8)
  • 8
    • 0020191071 scopus 로고
    • A new approach to the determination of MS-barrier heights from photoelectric data and/or an alternative way to determine the value of the Richardson constant
    • (1982) Solid-State Electronics , vol.10 , pp. 989
    • de Sousa Pires1    Donoval2    Tove3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.