|
Volumn 32, Issue 11, 1989, Pages 961-964
|
A self consistent approach to IV-measurements on rectifying metal-semiconductor contacts
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
BARRIER HEIGHT;
IV-MEASUREMENTS;
RECOMBINATION CURRENT;
RECTIFYING METAL-SEMICONDUCTOR CONTACTS;
SEMICONDUCTOR DIODES;
|
EID: 0024767982
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/0038-1101(89)90156-1 Document Type: Article |
Times cited : (35)
|
References (8)
|