Intense 1540 nm emission from Er doped Ce:YAG phosphor

Applied Physics Letters

Volumn 91, Issue 15, 2007, Pages

  Meng, Jian Xin ^a   Cheah, Kok Wai ^a   Shi, Zhao Pu ^b   Li, Jin Qing ^b  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRON ENERGY LEVELS; ENERGY TRANSFER; INFRARED RADIATION; LIGHT EMISSION; MATRIX ALGEBRA; RELAXATION PROCESSES; SENSITIVITY ANALYSIS;

CROSS RELAXATION PROCESS; INORGANIC MATRIX; YAG PHOSPHOR;

PHOSPHORS;

EID: 35248814249     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2785136     Document Type: Article

References (19)

1. L. H. Slooff, A. Van Blaaderen, A. Polman, G. A. Hebbink, S. I. Klink, F. C. J. M. van Veggel, D. N. Reinhoudt, and J. W. Hofstraat, J. Appl. Phys. 91, 3955 (2002).
2. Z. F. Krasilnik, B. A. Andreev, D. I. Kryzhkov, L. V. Krasilnikova, V. P. Kuznetsov, D. Y. Remizov, V. B. Shmagin, M. V. Stepikhova, A. N. Yablonskiy, T. Gregorkievicz, N. Q. Vinh, W. Jantsch, H. Przybylinska, V. Y. Timoshenko, and D. M. Zhigunov, J. Mater. Res. 21, 574 (2006).
3. C. Bader and I. Krejci, Am. J. Dent. 19, 178 (2006).
4. J. X. Meng, K. F. Li, J. Yuan, L. L. Zhang, W. K. Wong, and K. W. Cheah, Chem. Phys. Lett. 332, 313 (2000).
5. G. A. Hebbink, L. Grave, L. A. Woldering, D. N. Reinhoudt, and F. C. J. M. van Veggel, J. Phys. Chem. A 107, 2483 (2003).
6. N. S. Baek, Y. H. Kim, and H. K. Kim, J. Nonlinear Opt. Phys. Mater. 15, 369 (2006).
7. R. H. C. Tan, M. Motevalli, I. Abrahams, P. B. Wyatt, and W. P. Gillin, J. Phys. Chem. B 110, 24476 (2006).
8. J. W. Stouwdam, M. Raudsepp, and F. C. J. M. van Veggel, Langmuir 21, 7003 (2005).
9. J. W. Stouwdam and F. C. J. M. van Veggel, Nano Lett. 2, 733 (2002).
10. G. A. Hebbink, J. W. Stouwdam, D. N. Reinhoudt, and F. C. J. M. van Veggel, Adv. Mater. (Weinheim, Ger.) 14, 1147 (2002).
11. L. Luo, X. X. Zhang, K. F. Li, K. W. Cheah, J. X. Shi, W. K. Wong, and M. L. Gong, Adv. Mater. (Weinheim, Ger.) 16, 1664 (2004).
12. Y. C. Kang, E. J. Kim, D. Y. Lee, and H. D. Park, J. Alloys Compd. 247, 266 (2002).
13. O. M. Ntwaeaborwa, H. C. Swart, R. E. Kroon, P. H. Holloway, and J. R. Botha, J. Phys. Chem. Solids 67, 1749 (2006).
14. G. H. Wu, R. Chen, and Q. Y. Zhang, Spectrosc. Spectral Anal. (Beijing) 20, 560 (2000).
15. D. Haranath, H. Chander, P. Sharma, and S. Singh, Appl. Phys. Lett. 89, 173118 (2006).
16. T. S. Chernaya, L. A. Muradyan, V. A. Sarin, E. M. Uyukin, Kh. S. Bagdasarov, and V. I. Simonov, Kristallografiya 34, 1295 (1989).
17. Herbert C. Cheung, in Topics in Fluorescence Spectroscopy, edited by, Joseph R. Lakowicz, (Kluwer, New York, 2002), Vol. 2, p. 130.
18. G. Dantelle, M. Mortier, D. Vivien, and G. Patriarche, Phys. Chem. Glasses 47, 150 (2006).
19. E. Sani, A. Toncelli, and M. Tonelli, Opt. Mater. (Amsterdam, Neth.) 28, 1317 (2006).