Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction

Materials Research Bulletin

Volumn 42, Issue 12, 2007, Pages 1986-1994

  Adam, Alia ^a  

^a Assiut Branch   (Egypt)

Author keywords

A. Semiconductor; C. X ray diffraction; D. Crystal structure

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL STRUCTURE; LATTICE CONSTANTS; RIETVELD REFINEMENT; SCANNING ELECTRON MICROSCOPY; SOLUBILITY; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

MICROSTRUCTURE TUBES; SEMICONDUCTING SYSTEMS; SHEET STRUCTURES; SPACE GROUPS;

SEMICONDUCTOR MATERIALS;

EID: 35148888695     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.02.027     Document Type: Article

References (21)

1. Mishra S.K., Satpathy S., and Jepsen O. J. Phys.: Condens. Matter 9 (1997) 461
2. Nascimento V.B., de Carvalho V.E., Paniago R., Soares E.A., Ladeira L.O., and Pfannes H.D. J. Electron Spectrosc. Relat. Phenom. 104 (1999) 99
3. Disalvo F.J. Science 285 (1999) 703
4. Mane R.K., Ajalkar B.D., and Bhosale P.N. Mater. Chem. Phys. 84 (2004) 247
5. Feutelais Y., and Legendre B. Mater. Res. Bull. 28 (1993) 591
6. Deng Y., Zhou X.-S., and Nan C.-W. Phys. Status Solidi A 199 2 (2003) 265
7. Iwasaki H., Ohishi A., Kajihara T., and Sano S. Jpn. J. Appl. Phys. 42 (2003) 5477
8. Cui H., Liu H., Li X., Wang J., Han F., Zhang X., and Boughton R.I. J. Solid State Chem. 177 (2004) 4001
9. Miller G.R., and Li C.-Y. J. Phys. Chem. Solids 26 (1965) 173
10. Furdyna J.K. J. Appl. Phys. 64 (1988) R29
11. Ohno H., Munekata H., Penny T., et al. Phys. Rev. Lett. 68 (1992) 2664
12. Munekata H., Ohno H., von Molnar S., et al. Phys. Rev. Lett. 63 (1989) 1849
13. Ohno H., Shen A., Matsukura F., et al. Appl. Phys. Lett. 69 (1996) 363
14. Story T., Galazka R.R., Frankel R.B., and Wolff P.A. Phys. Rev. Lett. 56 (1989) 777
15. Dyck J.S., et al. J. Appl. Phys. 94 (2003) 7631
16. Kul'bachinskii V.A., Kaminskii A.Y., Kindo K., Narumi Y., Suga K., Lostak P., and Svanda P. JETP Lett. 73 (2001) 352
17. Rietveld H.M. J. Appl. Crystallogr. 2 (1969) 65
18. WinRietveld, Bruker AXS, Version 3.0, 1998.
19. JCPDS-International Centre for Diffraction Data, PCPDFWIN V. 2.01, 1998.
20. K. Branderburg, Diamond: Visual Crystal Structure Information System, Crystal Impact GbR, Version 3.0, 2004.
21. Wiese J.R., and Muldawer L. J. Phys. Chem. Solids 15 (1959) 13