XPS and EELS study of the bismuth selenide

Journal of Electron Spectroscopy and Related Phenomena

Volumn 104, Issue 1-3, 1999, Pages 99-107

  Nascimento, V B ^a   De Carvalho, V E ^a   Paniago, R ^a   Soares, E A ^a   Ladeira, L O ^a   Pfannes, H D ^a  

^a FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

Bi2Se3; Electron energy loss spectroscopy (EELS); Electronic transitions; Plasmons; V2VI3 compounds; X ray photoelectron spectroscopy (XPS)

Indexed keywords

CHARGE TRANSFER; CRYSTALS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSITIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERBAND TRANSITIONS; PLASMONS; VALENCE BANDS;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 0032591104     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00012-2     Document Type: Article

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