Crystalline orientation of BiMnO 3 thin films grown by rf-sputtering

Applied Surface Science

Volumn 254, Issue 1 SPEC. ISS., 2007, Pages 160-163

  Kaul, E E ^a   Haberkorn, N ^a   Guimpel, J ^a  

^a CENTRO ATÓMICO BARILOCHE   (Argentina)

Author keywords

BiMnO 3; Magnetoelectric; Multiferroic materials; Multiferroism; rf sputtering; Thin films

Indexed keywords

BISMUTH COMPOUNDS; CURIE TEMPERATURE; MAGNETIZATION; PARAMETER ESTIMATION; SPUTTERING; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MONOCLINIC STRUCTURE; MULTIFERROIC MATERIALS; PRELIMINARY MAGNETIZATION; RADIOFREQUENCY SPUTTERING;

THIN FILMS;

EID: 35148854696     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.012     Document Type: Article

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