Effects of PWB design factors on PTH reliability

Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics

Volumn 33, Issue 8, 2007, Pages 954-958

  Chen, Ying ^a   Huo, Yujie ^a   Xie, Jingsong ^a   Zhang, Yuan ^b  

^a BEIHANG UNIVERSITY   (China)

^b HUAWEI TECHNOLOGIES CO LTD   (China)

Author keywords

Design parameter; Glass transition temperature; Lifetime; Plated through hole; Reliability

Indexed keywords

ASPECT RATIO; ELECTRIC WIRING; ELECTRON TRANSITIONS; GLASS TRANSITION; STRESS CONCENTRATION; SUPERCONDUCTING TRANSITION TEMPERATURE;

DESIGN PARAMETER; GLASS TRANSITION TEMPERATURE; LIFETIME; PLATED THROUGH HOLE;

PRINTED CIRCUIT BOARDS;

EID: 34948866786     PISSN: 10015965     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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