Identification of bulk and surface sulfur impurities in Ti O2 by synchrotron x-ray absorption near edge structure

Applied Physics Letters

Volumn 91, Issue 14, 2007, Pages

  Smith, M F ^a,c   Setwong, Kongthip ^b   Tongpool, Rungnapa ^b   Onkaw, Darin ^d   Na Phattalung, Sutassana ^d   Limpijumnong, Sukit ^d   Rujirawat, Saroj ^d  

^a National Synchrotron Research Center Thailand   (Thailand)

^b NATIONAL METAL AND MATERIALS TECHNOLOGY CENTER   (Thailand)

^c UNIVERSITY OF QUEENSLAND   (Australia)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; SULFUR; SURFACE STRUCTURE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY POWDER DIFFRACTION;

ANNEALING TEMPERATURE; FIRST PRINCIPLES SIMULATIONS; SYNCHROTRON X RAY ABSORPTION NEAR EDGE STRUCTURE;

TITANIUM DIOXIDE;

EID: 34948853919     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2793627     Document Type: Article

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