Conservation of dielectric constant upon amorphization in perovskite oxides

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 10, 2007, Pages

  Delugas, Pietro ^a   Fiorentini, Vincenzo ^a,b   Filippetti, Alessio ^b   Pourtois, Geoffrey ^c  

^a NXP SEMICONDUCTORS   (Netherlands)

^b UNIVERSITY OF CAGLIARI   (Italy)

^c IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34848913173     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.104112     Document Type: Article

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