Precision thickness and refractive index imaging of molecular films

Review of Scientific Instruments

Volumn 78, Issue 9, 2007, Pages

  Balmer, T E ^a   Heuberger, M ^b  

^a ETH ZURICH   (Switzerland)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CCD CAMERAS; ETALONS; FILM THICKNESS; INTERFEROMETRY; OPTICAL MULTILAYERS; REFRACTIVE INDEX; WAVELENGTH;

COMBLIKE ETALON SPECTRUM; MOLECULAR FILMS; OPTICAL SPECTRAL CORRELATION (OSC) IMAGE; PRECISION THICKNESS;

THIN FILMS;

EID: 34848849441     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2777369     Document Type: Article

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