Accuracy of roughness exponent measurement methods

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 76, Issue 3, 2007, Pages

  Bakke, Jan Øystein Haavig ^a   Hansen, Alex ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; SPECTRUM ANALYSIS; SYSTEMATIC ERRORS; WAVELET ANALYSIS;

ROUGHNESS EXPONENTS; WAVELET COEFFICIENTS METHOD;

ROUGHNESS MEASUREMENT;

EID: 34848847181     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.76.031136     Document Type: Article

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