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Volumn , Issue , 2006, Pages 59-62

A built-in tester for modulation noise in a wireless transmitter

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CELLULAR TELEPHONE SYSTEMS; CMOS INTEGRATED CIRCUITS; DIGITAL ARITHMETIC; INSTRUMENT TESTING; INTEGRATED CIRCUITS; MODULATION; PROGRAMMABLE LOGIC CONTROLLERS; SOFTWARE DESIGN; STANDARDS; TESTING;

EID: 34748852219     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DCAS.2006.321033     Document Type: Conference Paper
Times cited : (7)

References (6)
  • 1
    • 10444260492 scopus 로고    scopus 로고
    • All-digital TX frequency synthesizer and discrete-time receiver for Bluetooth radio in 130-nm CMOS
    • Dec
    • R. B. Staszewski, K. Muhammad, D. Leipold, et al., "All-digital TX frequency synthesizer and discrete-time receiver for Bluetooth radio in 130-nm CMOS", IEEE Journal of Solid-State Circuits, vol. 39, issue 12, pp. 2278-2291, Dec. 2004.
    • (2004) IEEE Journal of Solid-State Circuits , vol.39 , Issue.12 , pp. 2278-2291
    • Staszewski, R.B.1    Muhammad, K.2    Leipold, D.3
  • 3
    • 0035245795 scopus 로고    scopus 로고
    • An All-Digital Built-In Self-Test for High-Speed Phase-Locked Loops
    • Feb
    • S. Kim and M. Soma, "An All-Digital Built-In Self-Test for High-Speed Phase-Locked Loops", IEEE Transactions on Circuits and Systems - II, vol. 48, no. 2, Feb. 2001.
    • (2001) IEEE Transactions on Circuits and Systems - II , vol.48 , Issue.2
    • Kim, S.1    Soma, M.2
  • 5
    • 0242346481 scopus 로고    scopus 로고
    • A general theory of phase noise in electrical oscillators
    • Feb
    • Hajimiri, T. H. Lee, "A general theory of phase noise in electrical oscillators", IEEE Journal of Solid-State Circuits, vol. 35, no. 3, pp. 326-336, Feb. 1998.
    • (1998) IEEE Journal of Solid-State Circuits , vol.35 , Issue.3 , pp. 326-336
    • Hajimiri, T.H.L.1
  • 6
    • 46249095011 scopus 로고    scopus 로고
    • Test Specification for Bluetooth RF (document number 20.B.353/0.92 of the Bluetooth SIG, 2003).
    • Test Specification for Bluetooth RF (document number 20.B.353/0.92 of the Bluetooth SIG, 2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.