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Volumn 91, Issue 12, 2007, Pages
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Conductive atomic force microscopy investigation of transverse current across metallic and semiconducting single-walled carbon nanotubes
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHARGE TRANSFER;
ELECTRIC CURRENTS;
ELECTRON TUNNELING;
PHONON SCATTERING;
SEMICONDUCTOR DEVICES;
CARRIER PATHS;
NANODEVICES;
SEMICONDUCTING NANOTUBES;
TRANSVERSE CURRENTS;
SINGLE-WALLED CARBON NANOTUBES (SWCN);
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EID: 34648826746
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2785168 Document Type: Article |
Times cited : (13)
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References (16)
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