메뉴 건너뛰기




Volumn 91, Issue 12, 2007, Pages

Conductive atomic force microscopy investigation of transverse current across metallic and semiconducting single-walled carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; ELECTRIC CURRENTS; ELECTRON TUNNELING; PHONON SCATTERING; SEMICONDUCTOR DEVICES;

EID: 34648826746     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2785168     Document Type: Article
Times cited : (13)

References (16)
  • 1
    • 0037051008 scopus 로고    scopus 로고
    • H. Dai, Surf. Sci. 500, 218 (2002).
    • (2002) Surf. Sci. , vol.500 , pp. 218
    • Dai, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.