Reversible strain effect in La0.7 Sr0.3 Mn O3 step edge junctions

Applied Physics Letters

Volumn 91, Issue 12, 2007, Pages

  Gangineni, R B ^a   Schultz, L ^a   Thiele, C ^a   Monch I ^a   Dorr K ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; GRAIN BOUNDARIES; LANTHANUM ALLOYS; MAGNETORESISTANCE; SPIN POLARIZATION; STRAIN RATE;

ELECTRIC TRANSPORT; ELECTRIC VOLTAGE; FILM RESISTANCE; STRAIN EFFECT;

SEMICONDUCTOR JUNCTIONS;

EID: 34648812765     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2787966     Document Type: Article

References (17)

1. H. Hilgenkamp and J. Mannhart, Rev. Mod. Phys. 74, 485 (2002).
2. C. L. Jia, B. Kabius, K. Urban, K. Herrmann, J. Schubert, W. Zander, and A. I. Braginski, Physica C 196, 211 (1992).
3. M. Ziese, G. Heydon, R. Höhne, P. Esquinazi, and J. Dienelt, Appl. Phys. Lett. 74, 1481 (1999).
4. L. M. Wang, C.-C. Liu, H. C. Yang, and H. E. Horng, J. Appl. Phys. 95, 4928 (2004).
5. Y.-A. Soh, P. G. Evans, Z. Cai, B. Lai, C.-Y. Kim, G. Aeppli, N. D. Mathur, M. G. Blamire, and E. D. Isaacs, J. Appl. Phys. 91, 7742 (2002).
6. M. Paranjape, J. Mitra, A. K. Raychaudhuri, N. K. Todd, N. D. Mathur, and M. G. Blamire, Phys. Rev. B 68, 144409 (2003).
7. M. Ziese, Phys. Rev. B 60, R738 (1999).
8. N. Kozlova, K. Dörr, D. Eckert, A. Handstein, Y. Scourski, T. Walter, K.-H. Müller, and L. Schultz, J. Appl. Phys. 93, 8325 (2003).
9. N. Kozlova, K. Dörr, D. Eckert, T. Walter, and K.-H. Müller, J. Magn. Magn. Mater. 261, 48 (2003).
10. S. Lee, H. Y. Hwang, B. I. Shraiman, W. D. Ratcliff II, and S.-W. Cheong, Phys. Rev. Lett. 82, 4508 (1999).
11. R. Gunnarsson, A. Kadigrobov, and Z. Ivanov, Phys. Rev. B 66, 024404 (2002).
12. J. Klein, C. Höfener, S. Uhlenbruck, L. Alff, B. Büchner, and R. Gross, Europhys. Lett. 47, 371 (1999).
13. R. B. Gangineni, K. Dörr, N. Kozlova, K. Nenkov, K.-H. Müller, L. Seethalakshmi, and L. Schultz, J. Appl. Phys. 99, 053904 (2006).
14. S.-E. Park and T. R. Shrout, J. Appl. Phys. 82, 1804 (1997).
15. C. Thiele, K. Dörr, O. Bilani, J. Rödel, and L. Schultz, Phys. Rev. B 75, 054408 (2007).
16. C. Thiele, K. Dörr, S. Fähler, L. Schultz, D. C. Meyer, A. A. Levin, and P. Paufler, Appl. Phys. Lett. 87, 262502 (2005).
17. N. Furukawa, J. Phys. Soc. Jpn. 66, 2523 (1997).