Mechanism and controlling of silver migration in cofired multilayer devices with AG-PD inner electrodes

Ferroelectrics

Volumn 263, Issue 1, 2001, Pages 267-272

  Zuo, Ruzhong ^a   Li, Longtu ^a   Gui, Zhilun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Cofiring; Ferroelectrics; Interface; Silver migration

Indexed keywords

AG-PD ELECTRODES; CO-FIRING; COFIRED; ELECTRICAL PROPERTY; FERROELECTRICS; INNER-ELECTRODES; INTERFACE; INTERFACIAL DIFFUSION; MULTI-LAYER DEVICES; MULTILAYER CERAMIC DEVICES; SILVER MIGRATION; SINTERING PROCESS; VAPOR PHASE;

CERAMIC MATERIALS; ELECTRIC PROPERTIES; ELECTRODES; MULTILAYERS; PALLADIUM; PHASE INTERFACES; PLASTIC DEFORMATION; SILVER ALLOYS; SINTERING;

SILVER;

EID: 34548862950     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190108225210     Document Type: Conference Paper

References (9)

1. J. Yamamatsu, N. Kawano, J. Powd. Sour. 60, 199-203 (1996).
2. T. Nomura, Jpn. J. Appll. Phys. 34, Part 1 No. 9B, 5389-95 (1995).
3. R. Zuo, L. Li, Y. Tang, Z. Gui, J. Mater. Sci. 32, 3257-62 (2000).
4. R. Zuo, L. Li, Z. Gui, Ceram. Inter. 26, 673-76 (2000).
5. T. Nakamura, Y. Okano, J. Mater. Sci. 33, 1091-94 (1998).
6. S. L. Swartz, T. R. Shrout, J. Am. Ceram. Soc. 67, 311-15 (1984).
7. J. G. Pepin, Adv. Ceram. Mater. 3, 517-519 (1988).
8. K. M. Myles, Acta Meta. 13, 109-13 (1965).
9. W. Hackenberger, Ph.D thesis, Pennsylvania University, p. 367 (1995).