Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies

Thin Solid Films

Volumn 515, Issue 24 SPEC. ISS., 2007, Pages 8624-8631

  Modreanu, M ^a   Nolan, M ^a   Elliott, S D ^a   Durand, O ^b   Servet, B ^b   Garry, G ^b   Gehan, H ^b   Huyberechts, G ^c   Papadopoulou, E L ^d   Androulidaki, M ^d   Aperathitis, E ^d  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b THALES RESEARCH AND TECHNOLOGY   (France)

^c UMICORE   (Belgium)

^d INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

Author keywords

FTIR; Raman scattering; Spectroscopic ellipsometry; SrCu2O2; X ray diffraction

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROSTRUCTURE; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; STRONTIUM COMPOUNDS; X RAY DIFFRACTION;

MICROSTRUCTURAL PROPERTIES; NON-TEXTURED POLYCRYSTALLINE; SMOOTH SURFACE;

THIN FILMS;

EID: 34548861204     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.103     Document Type: Article

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