ABE-SONOS (Bandgap Engineered SONOS) NAND for post-floating gate era flash memory

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2007, Pages

  Lue, Hang Ting ^a   Wang, Szu Yu ^a   Lai, Erh Kun ^a   Hsieh, Kuang Yeu ^a   Liu, Rich ^a   Lu, Chih Yuan ^a  

^a MACRONIX INTERNATIONAL CO LTD   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ENERGY GAP; LEAKAGE CURRENTS; TUNNEL DIODE AMPLIFIERS;

DATA RETENTION; EFFICIENT HOLE TUNNELING; FLOATING GATE NAND FLASH; HOLE TUNNELING;

FLASH MEMORY;

EID: 34548844731     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2007.378899     Document Type: Conference Paper

References (6)

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