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Volumn , Issue , 2007, Pages

3D chip-to-chip stacking with through silicon interconnects

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; SILICON COMPOUNDS; SILICON WAFERS; THERMAL EFFECTS; THREE DIMENSIONAL;

EID: 34548833875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2007.378925     Document Type: Conference Paper
Times cited : (12)

References (6)
  • 1
    • 0031270573 scopus 로고    scopus 로고
    • Three dimensional metallization for vertically integrated circuits
    • P. Ramm, et al., "Three dimensional metallization for vertically integrated circuits, " Microelectron. Eng., Vol. 3738 (1997), pp.39-47.
    • (1997) Microelectron. Eng , vol.3738 , pp. 39-47
    • Ramm, P.1
  • 2
    • 0035300622 scopus 로고    scopus 로고
    • K. Takahashi, et al., Current Status of Research and Development for Three-Dimensional Chip Stack Technology, Jpn. J. Appl. Phys., 40, No.4 B(2001), pp.3032-3037.
    • K. Takahashi, et al., "Current Status of Research and Development for Three-Dimensional Chip Stack Technology," Jpn. J. Appl. Phys., Vol. 40, No.4 B(2001), pp.3032-3037.
  • 3
    • 0037674530 scopus 로고    scopus 로고
    • Development of Distributed Sensing Systems of Autonomous Micro-Modules
    • New Orleans, Louisiana, May
    • rd Electronic Components and Technology Conf, New Orleans, Louisiana, May, 2003, pp. 1147-1152.
    • (2003) rd Electronic Components and Technology Conf , pp. 1147-1152
    • Barton, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.