Test circuit for study of CMOS process variation by measurement of analog characteristics

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2007, Pages 37-41

  Gettings, Karen M G V ^a   Boning, Duane S ^a  

^a Massachusetts Institute of Technology Cambridge

Author keywords

CBCM; Low leakage switches; Scan chain; Test structures

Indexed keywords

ANALOG CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; INTEGRATED CIRCUIT LAYOUT; OPTICAL INTERCONNECTS; OSCILLATORS (ELECTRONIC); PARAMETER ESTIMATION; TRANSISTORS; VOLTAGE MEASUREMENT;

DIGITAL TEST STRUCTURES; LOW-LEAKAGE SWITCHES; RING OSCILLATORS; SCAN CHAINS;

CMOS INTEGRATED CIRCUITS;

EID: 34548833831     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2007.374451     Document Type: Conference Paper

References (11)

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7. This extraction, and data shown in Figure 13, is a correction to the printed proceedings paper.
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