A CMOS front-end for a lossy image compression sensor

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2007, Pages 2838-2841

  Lin, Zhiqiang ^a   Hoffman, Michael W ^a   Leon, Walter D ^a   Schemm, Nathan ^a   Balkir, Sina ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTATIONAL COMPLEXITY; DISCRETE WAVELET TRANSFORMS; PIXELS;

CMOS TEST CHIPS; IMAGE DECOMPOSITION; PIXEL DESIGN;

IMAGE COMPRESSION;

EID: 34548818797     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iscas.2007.378763     Document Type: Conference Paper

References (7)

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7. Z. Lin, M. W. Hoffman, W. D. Leon-Salas, N. Schemm, and S. Balkir, "Effects of charge-based computation non-idealities on CMOS image compression sensor," in Proc. IEEE International Symposium on Circuits and Systems (ISCAS'06), Island of Kos, Greece, May 2006, pp. 5187-5190.