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Volumn , Issue , 2006, Pages 5187-5190

Effects of charge-based computation non-idealities on CMOS image compression sensors

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; IMAGE COMPRESSION; PIXELS; SENSOR ARRAYS;

EID: 34547362205     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 1
    • 0035693590 scopus 로고    scopus 로고
    • A 10,000 frames/s CMOS digital pixel sensor
    • Dec
    • S. Kleinfelder, S. Lim, X. Liu, and A. E. Gamal, "A 10,000 frames/s CMOS digital pixel sensor," IEEE J. Solid-State Circuits, vol. 36, no. 12, pp. 2049-2058, Dec. 2001.
    • (2001) IEEE J. Solid-State Circuits , vol.36 , Issue.12 , pp. 2049-2058
    • Kleinfelder, S.1    Lim, S.2    Liu, X.3    Gamal, A.E.4
  • 2
    • 0036918529 scopus 로고    scopus 로고
    • Single-chip CMOS image sensor for mobile applications
    • Dec
    • K. Yoon, C. Kim, B. Lee, and D. Lee, "Single-chip CMOS image sensor for mobile applications," IEEE J. Solid-State Circuits, vol. 37, no. 12, pp. 1839-1845, Dec. 2002.
    • (2002) IEEE J. Solid-State Circuits , vol.37 , Issue.12 , pp. 1839-1845
    • Yoon, K.1    Kim, C.2    Lee, B.3    Lee, D.4
  • 4
    • 1542605477 scopus 로고    scopus 로고
    • A pipelined temporal difference imager
    • Mar
    • V. Gruev and R. Etienne-Cummings, "A pipelined temporal difference imager," IEEE J. Solid-State Circuits, vol. 39, no. 3, pp. 538-543, Mar. 2004.
    • (2004) IEEE J. Solid-State Circuits , vol.39 , Issue.3 , pp. 538-543
    • Gruev, V.1    Etienne-Cummings, R.2
  • 5
    • 13444249903 scopus 로고    scopus 로고
    • A 375 × 365 high-speed 3-d range-finding image sensor using, row-parallel search architecture and multisampling technique
    • Feb
    • Y. Oike, M. Ikeda, and K. Asada, "A 375 × 365 high-speed 3-d range-finding image sensor using, row-parallel search architecture and multisampling technique," IEEE J. Solid-State Circuits, vol. 40, no. 2, pp.444-453, Feb. 2005.
    • (2005) IEEE J. Solid-State Circuits , vol.40 , Issue.2 , pp. 444-453
    • Oike, Y.1    Ikeda, M.2    Asada, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.