High-precision calculation of quasistatic field near a photocathode surface microrelief

Journal of Electrostatics

Volumn 65, Issue 12, 2007, Pages 735-741

  Gorlov, Timofey ^a  

^a NATIONAL RESEARCH NUCLEAR UNIVERSITY MEPHI   (Russian Federation)

Author keywords

Electrostatic field calculation; Laplace's equation; Microrelief surface; Photocathode; Ritz method; Roughness

Indexed keywords

ELECTRIC FIELD EFFECTS; FINITE ELEMENT METHOD; LAPLACE EQUATION; PHOTOELECTRIC DEVICES; PHOTOELECTRONS; SURFACE ROUGHNESS;

RITZ METHOD; SURFACE MICRORELIEF;

PHOTOCATHODES;

ELECTRIC FIELD EFFECTS; FINITE ELEMENT METHOD; LAPLACE EQUATION; PHOTOCATHODES; PHOTOELECTRIC DEVICES; PHOTOELECTRONS; SURFACE ROUGHNESS;

EID: 34548685231     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2007.05.010     Document Type: Article

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