메뉴 건너뛰기




Volumn , Issue , 2006, Pages 121-123

Photocathode roughness impact on photogun beam characteristics

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE ROUGHNESS;

EID: 84898811172     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 2
    • 0345283184 scopus 로고    scopus 로고
    • New principles in photochronography of femtosecond resolution
    • A.M. Tron, "New principles in photochronography of femtosecond resolution", Proc. of SPIE 4948 (2003) 141;
    • (2003) Proc. of SPIE , vol.4948 , pp. 141
    • Tron, A.M.1
  • 6
    • 41349119551 scopus 로고    scopus 로고
    • Nonlinear electrostatic emittance compensation in kv, fs electron bunches
    • S.B. van der Geer et al., "Nonlinear Electrostatic emittance Compensation in kV, Fs Electron Bunches", Phys. Rev. E 65 (2002) 046501.
    • (2002) Phys. Rev. e , vol.65 , pp. 046501
    • Geer Der Van, S.B.1
  • 7
    • 0017492766 scopus 로고
    • 0.1-10-kev x-ray-induced electron emissions from solids-models and secondary electron measurements
    • B.L. Henke, J.A. Smith, "0.1-10-keV X-ray-induced Electron Emissions from Solids-Models and Secondary Electron Measurements", J. Appl. Phys. 48 (1977) 1852.
    • (1977) J. Appl. Phys , vol.48 , pp. 1852
    • Henke, B.L.1    Smith, J.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.